XCT - Scanner

The Advanced Materials Research Laboratory (AMRL) is equipped with the Nikon XT H 225 LC X-ray computed tomography system, fitted with a Deben CT 10kN cell which allows specimens to be imaged in real time under controllable environmental conditions of temperature, pressure and in a liquid or dry environment. This unique system allows breathtaking volume imaging of materials, reaching an optimum vauxhall size of 1.5μm. It is fitted with a 225kV X-ray source of both reflection and transmission. The Deben CT 10kN cell allows us to image specimens in situ under a range of conditions, to determine how materials alter at the micro-scale uinder applied stress, extreme temperatures and in a liquid environment if required.

NIKON XT H 320

Excellent for fault detection, failure analysis, assembly inspection of complex mechanisms and analysis of the biological structures