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Mr Gunnar Kusch

Research Associate

Physics

Publications

Analysis of doping concentration and composition in wide bandgap AlGaN:Si by wavelength dispersive X-ray spectroscopy
Kusch Gunnar, Mehnke Frank, Enslin Johannes, Edwards Paul R, Wernicke Tim, Kneissl Michael, Martin Robert W
Semiconductor Science and Technology Vol 32, (2017)
http://dx.doi.org/10.1088/1361-6641/aa58cf
Self-healing thermal annealing : surface morphological restructuring control of GaN nanorods
Conroy Michelle, Li Haoning, Zubialevich Vitaly Z., Kusch Gunnar, Schmidt Michael, Collins Timothy, Glynn Colm, Martin Robert W., O'Dwyer Colm, Holmes Justin D., Parbrook Peter J., Morris Michael D.
Crystal Growth and Design Vol 16, pp. 6769-6775, (2016)
http://dx.doi.org/10.1021/acs.cgd.6b00756
Correction: Site controlled red-yellow-green light emitting InGaN quantum discs on nano-tipped GaN rods
Conroy M., Li H., Kusch G., Zhao C., Ooi B., Edwards P. R., Martin R. W., Holmes J. D., Parbrook P. J.
Nanoscale Vol 8, pp. 13521, (2016)
http://dx.doi.org/10.1039/C6NR90137A
Site controlled red-yellow-green light emitting InGaN quantum discs on nano-tipped GaN rods
Conroy M., Li H., Kusch G., Zhao C., Ooi B., Edwards P. R., Martin R. W., Holmes J. D., Parbrook P. J.
Nanoscale Vol 8, pp. 11019-11026, (2016)
http://dx.doi.org/10.1039/c6nr00116e
Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
Kusch Gunnar, Nouf-Allehiani M., Mehnke Frank, Kuhn Christian, Edwards Paul R., Wernicke Tim, Knauer Arne, Kueller Viola, Naresh-Kumar G., Weyers Markus, Kneissl Michael, Trager-Cowan Carol, Martin Robert W.
Applied Physics Letters Vol 107, (2015)
http://dx.doi.org/10.1063/1.4928667
Electron channeling contrast imaging of defects in III-nitride semiconductors
Trager-Cowan C., Naresh-Kumar G., Allehiani N., Kraeusel S., Hourahine B., Vespucci S., Thomson D., Bruckbauer J., Kusch G., Edwards P. R., Martin R. W., Mauder C., Day A. P., Winkelmann A., Vilalta-Clemente A., Wilkinson A. J., Parbrook P. J., Kappers M. J., Moram M. A., Oliver R. A., Humphreys C. J., Shields P., Le Boulbar E. D., Maneuski D., O'Shea V., Mingard K. P.
Microscopy and Microanalysis Vol 20, pp. 1024-1025, (2014)
http://dx.doi.org/10.1017/S1431927614006849

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