Recent advances in algorithms and computing power have produced new methods which, for some problems, can outperform human expertise in data analysis, image processing and pattern recognition. These techniques have been used to examine and analyse features in single and multiple images, as well as video footage. such machine learning approaches are beginning to revolutionise areas including astronomy, medicine and machine vision.

This project aims to apply some of these new techniques to rapidly and accurately examine experimental data generated by the Semiconductor and Spectroscopy (SSD) Group using nanoscale scanning electron probe and microscopy measurements of semiconductor nano-structures.