A photo of one of our microscopes in the AMRL

Range of AnalysesCompositional Analysis

Scanning electron microscope
Scanning Electron Microscopes (SEM)
  • Two SEMs - a Field Emission SEM (HITACHI SU-6600) and a Tungsten Filament SEM (HITACHI S-3700)
  • A five-segment backscattered electron (BSE) detector for material composition imaging
  • Elemental analysis and mapping by energy dispersive spectroscopy (EDS)
  • Wavelength dispersive spectroscopy (WDS) for concentrations ≤500ppm or element overlaps (e.g. Mo/S)
  • Scanning transmission electron microscopy (STEM) on thin films
  • Variable pressure mode for non-conductive specimens – i.e. no need for carbon/gold coat
  • Non-destructive analysis on small components through a large chamber (300 x 110mm)
  • In-situ micro-mechanical tests (2kN load cell & video capture)
  • Environmental capability.
GD PROFILER 2 apparatus
Glow Discharge - Optical Emission Spectrometer (GD-OES)
  • The only GD-OES in Scotland and one of four in UK
  • For qualitative and quantitative elemental analysis, and depth profiling (up to 150μm) of conducting and non-conducting materials
  • Measures simultaneously multiple elements present in the material analysed
  • High sensitivity to all elements (including gaseous or carbon)
  • Provides elemental information for thin layers and coated components with a resolution of 1nm, where chemistry at the coating-substrate interface becomes paramount.

 

X-Ray Diffractometer
X-Ray Diffractometer (XRD)
  • The BRUKER D8 ADVANCE with DAVINCI XRD extracts structural information material and phase identification from metals and ceramics
  • Analysis can be completed at ambient and elevated temperatures up to 2000oC
  • Specimens can be in bulk or powder form, thin films, corrosion products or debris
  • Measured properties include phase composition, crystal structure, lattice parameters and mismatches, spatial orientation of crystals, crystallinity, residual stress, grain texture, and layer thickness.