Dr Jochen Bruckbauer

Research Fellow

Physics

Personal statement

I am a postdoctoral researcher in the Advanced Materials Diffraction Lab, part of the Department of Physics. I received my PhD from the University of Strathclyde in 2013, where I investigated the luminescence properties of III-nitride semiconductor nanostructures and light-emitting diodes (LEDs). I also hold a Diplom (equivalent to an MSc) in Physics from the Technical University of Munich.

My current research focuses on the structural characterisation of semiconductor materials—particularly III-nitrides—using electron diffraction techniques in the scanning electron microscope. This work aims to advance our understanding of nanoscale material properties and supports the development of next-generation optoelectronic devices.

Expertise

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Prize And Awards

Outstanding Poster Award at 13th International Conference on Nitride Semiconductors (ICNS13): Recipient; 10/7/2019
Fred Stern Memorial Prize 2014: Recipient; 26/6/2014
Best poster award for the Faculty of Science at the Strathclyde Research Day 2011: Recipient; 7/6/2011

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Publications

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Publications

Strain-induced modifications of thin film silicon membranes by physical bending: Margariti Eleni, Bruckbauer Jochen, Winkelmann Aimo, Guilhabert Benoit, Gunasekar Naresh-Kumar, Trager-Cowan Carol, Martin Robert, Strain Michael; Materials Vol 18 (2025); https://doi.org/10.3390/ma18102335
Strain and luminescence properties of hexagonal hillocks in N-polar GaN: Bruckbauer Jochen, Cios Grzegorz, Sarua Andrei, Feng Peng, Wang Tao, Hourahine Ben, Winkelmann Aimo, Trager-Cowan Carol, Martin Robert; Journal of Applied Physics Vol 137 (2025); https://doi.org/10.1063/5.0259840
Role of the electron transport layer in dictating the nanoscale heterogeneity in all-inorganic perovskite absorbers – correlating the optoelectronic and crystallographic properties: Nicholson Stefan, Bruckbauer Jochen, Edwards Paul R, Trager-Cowan Carol, Martin Robert W, Ivaturi Aruna; Journal of Materials Chemistry A Vol 13, pp. 11003-11014 (2025); https://doi.org/10.1039/D4TA07152B
Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction: Waters Dale M, Thompson Bethany, Ferenczi Gergely, Hourahine Ben, Cios Grzegorz, Winkelmann Aimo, Stark Christoph J M, Wetzel Christian, Trager-Cowan Carol, Bruckbauer Jochen; Journal of Applied Physics Vol 137 (2025); https://doi.org/10.1063/5.0244438
Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers: Nicholson Stefan, Bruckbauer Jochen, Edwards Paul R, Trager-Cowan Carol, Martin Robert W, Ivaturi Aruna; Journal of Materials Chemistry A Vol 12, pp. 25131-25139 (2024); https://doi.org/10.1039/D4TA01259C
Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction: Hiller Kieran P, Winkelmann Aimo, Hourahine Ben, Starosta Bohdan, Alasmari Aeshah, Feng Peng, Wang Tao, Parbrook Peter J, Zubialevich Vitaly Z, Hagedorn Sylvia, Walde Sebastian, Weyers Markus, Coulon Pierre-Marie, Shields Philip A, Bruckbauer Jochen, Trager-Cowan Carol; Microscopy and Microanalysis Vol 29, pp. 1879-1888 (2023); https://doi.org/10.1093/micmic/ozad118

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Research

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Research Interests

My research focuses on the structural characterisation and electron microscopy of semiconductor materials, with a particular emphasis on the III-nitride material system. III-nitrides are key to a wide range of applications, including solid-state lighting, optoelectronic devices (such as LEDs and laser diodes), high-power and high-frequency electronics, solar cells, water purification, and communication technologies.

A central aspect of my work is the application and development of scanning electron microscope (SEM)-based diffraction techniques, specifically electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI), using next-generation detectors. I am also interested in integrating these methods with complementary SEM techniques—such as cathodoluminescence (CL) hyperspectral imaging, X-ray microanalysis, and electron beam-induced current (EBIC)—to correlate structural and optical properties at the nano- and microscale.