Publications

The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan C, Alasmari A, Avis W, Bruckbauer Jochen, Edwards P R, Hourahine B, Kraeusel S, Kusch G, Johnston R, Naresh-Kumar G, Martin R W, Nouf-Allehiani M, Pascal E, Spasevski L, Thomson D, Vespucci S, Parbrook P J, Smith M D, Enslin J, Mehnke F, Kneissl M, Kuhn C, Wernicke T, Hagedorn S, Walde S, Weyers M, Coulon P-M, Shields P A, Zhang Y, Jiu L, Gong Y P, Smith R M, Wang T, Winkelmann A

Photonics Research (2019)

Synthesis of small gold nanorods and their subsequent functionalization with hairpin single stranded DNA

Mbalaha Zendesha S, Edwards Paul R, Birch David JS, Chen Yu

ACS Omega Vol 4, pp. 13740-13746 (2019)

https://doi.org/10.1021/acsomega.9b01200

Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope

Naresh-Kumar G, Bruckbauer J, Winkelmann A, Yu X, Hourahine B, Edwards P R, Wang T, Trager-Cowan C, Martin R W

Nano Letters Vol 19, pp. 3863-3870 (2019)

https://doi.org/10.1021/acs.nanolett.9b01054

Influence of InN and AlN concentration on the compositional inhomogeneity and formation of InN-rich regions in In_xAl_yGa_1−x−yN

Kusch Gunnar, Enslin Johannes, Spasevski Lucia, Teke Tolga, Wernicke Tim, Edwards Paul R, Kneissl Michael, Martin Robert W

Japanese Journal of Applied Physics Vol 58 (2019)

https://doi.org/10.7567/1347-4065/ab147a

Excitons in PL Spectra of Cu(In,Ga)Se₂ Single Crystals

Skidchenko E, Yakushev M V, Spasevski L, Edwards P R, Sulimov M A, Martin R W

Physics of the Solid State Vol 61, pp. 918-924 (2019)

https://doi.org/10.1134/S1063783419050330

A PL and PLE Study of High Cu Content Cu₂ZnSnSe₄ Films on Mo/Glass and Solar Cells

Sulimov M A, Yakushev M V, Forbes I, Prieto J M, Mudryi A V, Krustok J, Edwards P R, Martin R W

Physics of the Solid State Vol 61, pp. 908-917 (2019)

https://doi.org/10.1134/S1063783419050214

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Research interests

My research is focussed on the use of spectroscopic and microscopic methods in the analysis of semiconductors. The main materials of current interest to me are those based on the group III nitride quaternary system, Al_xGa_yIn_(1-x-y)N, and in particular nano-scale structures based on them. These have applications in many different areas, including solid-state lighting, data storage, communications and water purification. The techniques I use to study these materials include photoluminescence and electroluminescence spectroscopy, as well multiple modes of scanning electron microscopy (such as cathodoluminescence, electron beam-induced current and X-ray microanalysis). I am also interested in the application of multivariate statistical analysis techniques in the processing of the multidimensional data that these experimental methods yield.

Professional activities

Microscopy & Microanalysis 2018

Invited speaker

9/8/2018

PDI Topical Workshop on Cathodoluminescence of Semiconductor Nanostructures

Participant

16/4/2018

UK Nitrides Consortium Winter Conference 2018

Speaker

10/1/2018

12th International Conference on Nitride Semiconductors (ICNS-12)

Participant

23/7/2017

Microscience Microscopy Congress (MMC2015)

Invited speaker

2/7/2015

13th Australian Microbeam Analysis Symposium

Invited speaker

12/2/2015

more professional activities

Projects

Doctoral Training Partnership 2018-19 University of Strathclyde | Hunter, Daniel

Martin, Robert (Principal Investigator) Edwards, Paul (Co-investigator) Hunter, Daniel (Research Co-investigator)

01-Jan-2019 - 01-Jan-2023

Doctoral Training Partnership 2018-19 University of Strathclyde | Starosta, Bohdan

Hourahine, Ben (Principal Investigator) Edwards, Paul (Co-investigator) Starosta, Bohdan (Research Co-investigator)

01-Jan-2018 - 01-Jan-2022

Light-controlled manufacturing of semiconductor structures: a platform for next generation processing of photonic devices

Skabara, Peter (Principal Investigator) Dawson, Martin (Co-investigator) Edwards, Paul (Co-investigator) Martin, Robert (Co-investigator) Watson, Ian (Co-investigator)

"This Platform Grant (PG) will apply our internationally-leading expertise in structured illumination and hybrid inorganic/organic semiconductor optoelectronic devices to create new opportunities in the rapidly developing field of light-controlled manufacturing. Structured illumination fields can in principle be obtained from both inorganic (GaN) and organic LEDs, implemented on a macroscale via relay optics, or demagnified to a microscale. Novel manufacturing with photopolymerisable materials can firstly involve use of structured illumination as a novel means to control motorised stages. This technique can be combined with pattern-programmable UV excitation for mask-free photolithographic patterning, continuous photo-curing over larger fields, localised photochemical deposition, or other forms of photo-labile assembly. Process variants can also be envisaged in which arbitrarily positioned fluorescent objects or markers are 'hunted', and then subject to beam excitation for photocuring or targeted photoexcitation. This method could be used, for example, to immobilise individual colloidal quantum dots for use as emitters in quantum technology applications. Multifunctional devices with sensing ability, such as organic lasers for explosives detection, represent another excellent example of automated devices operating under remote conditions. Further examples of the envisaged uses of this technology include:

[1] LED microdisplay asset tags for management of high-value objects (artworks, nuclear fuel containers).
[2] Passive asset tags containing unique micro-patterns of fluorescent objects (eg. colloidal quantum dots, organic macromolecules) for higher-volume, anti-counterfeiting applications.
[3] Customisable continuous-flow micro-reactors for fine chemical manufacturing.
[4] Energy harvesting micro-modules to power other autonomous microsystems, where we will focus on organic PV and ambient-radiation (RF) approaches."

01-Jan-2017 - 30-Jan-2021

Quantitative non-destructive nanoscale characterisation of advanced materials

Hourahine, Ben (Principal Investigator) Edwards, Paul (Co-investigator) Roper, Marc (Co-investigator) Trager-Cowan, Carol (Co-investigator) Gunasekar, Naresh (Research Co-investigator)

"To satisfy the performance requirements for near term developments in electronic and optoelectronic devices will require pioneering materials growth, device fabrication and advances in characterisation techniques. The imminent arrival of devices a few atoms thick that are based on lighter materials such as graphene or boron nitride and also advanced silicon and diamond nano-structures. These devices pose new challenges to the currently available techniques for producing and understanding the resulting devices and how they fail. Optimising the performance of such devices will require a detailed understanding of extended structural defects and their influence on the properties of technologically relevant materials. These defects include threading dislocations and grain boundaries, and are often electrically active and so are strongly detrimental to the efficiency and lifetimes of nano-scale devices (a single badly-behaved defect can cause catastrophic device failure). These defects are especially problematic for devices such as silicon solar cells, advanced ultraviolet light emitting diodes, and advanced silicon carbide and gallium nitride based high power devices (used for efficient switching of large electrical currents or for high power microwave telecoms). For graphene and similar modern 2D materials, grain boundaries have significant impact on their properties as they easily span the whole size of devices.

Resolving all of these problems requires new characterisation techniques for imaging of extended defects which are simultaneously rapid to use, are non-destructive and are structurally definitive on the nanoscale. Electron channelling contrast imaging (ECCI) is an effective structural characterisation tool which allows rapid non-destructive visualisation of extended crystal defects in the scanning electron microscope. However ECCI is usually applied as a qualitative method of investigating nano-scale materials, has limitations on the smallest size features that it can resolve, and suffers from difficulties in interpreting the resulting images. This limits this technique's ability to work out the nature of defects in these advanced materials.

We will make use of new developments in energy resolving electron detectors, new advances in the modelling of electron beams with solids and the knowledge and experience of our research team and partners, to obtain a 6 fold improvement in the spatial resolution of the ECCI technique. This new energy-filtered way of making ECCI measurements will radically improve the quality of the information that can be obtained with this technique. We will couple our new capabilities to accurately measure and interpret images of defects to other advanced characterisation techniques. This will enable ECCI to be adopted as the technique of choice for non-destructive quantitative structural characterisation of defects in a wide range of important materials and provide a new technique to analyse the role of extended defects in electronic device failure."

01-Jan-2017 - 30-Jan-2020

Hysteretic photochromic switching (HPS) of europium-magnesium defects in gallium nitride: a potential route to a new solid-state qubit

O'Donnell, Kevin (Principal Investigator) Edwards, Paul (Co-investigator)

01-Jan-2015 - 03-Jan-2019

Nanoanalysis for Advanced Materials and Healthcare - EPSRC strategic equipment

Martin, Robert (Principal Investigator) Edwards, Paul (Co-investigator) Faulds, Karen (Co-investigator) Florence, Alastair (Co-investigator) Graham, Duncan (Co-investigator) Sefcik, Jan (Co-investigator) Ter Horst, Joop (Co-investigator) Trager-Cowan, Carol (Co-investigator) Uttamchandani, Deepak (Co-investigator) Wark, Alastair (Co-investigator)

This proposal seeks funding to deliver enhanced capability for characterising and assessing advanced nanomaterials using three complementary, leading edge techniques: Field-emission microprobe (EPMA), combined Raman/multiphoton confocal microscope (Raman/MP) and small angle X-ray scattering (SAXS). This suite of equipment will be used to generate a step-change in nanoanalysis capability for a multi-disciplinary team of researchers who together form a key part of Strathclyde's new Technology and Innovation Centre (TIC). The equipment will support an extensive research portfolio with an emphasis on functional materials and healthcare applications. The requested equipment suite will enable Strathclyde and other UK academics to partner with other world-leading groups having complementary analytical facilities, thereby creating an international collaborative network of non-duplicated facilities for trans-national access. Moreover the equipment will generate new research opportunities in advanced materials science in partnership with the National Physical Laboratory, UK industry and academia.

08-Jan-2015 - 07-Jan-2019

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