Range of AnalysesMicrostructural analysis

Scanning Electron Microscopes (SEM)

With the HITACHI S-3700N tungsten filament SEM and the HITACHI SU-6600 high-resolution field emission FE-SEM, we can perform a variety of analyses:

  • Morphological and topographical imaging
  • Surface fractography
  • Materials microstructure
  • Grain size and texture analysis by electron backscattered diffraction (EBSD)
  • Scanning transmission electron microscopy (STEM) on thin films
  • Variable pressure mode for non-conductive specimens – i.e. no need for carbon/gold coat
  • Non-destructive analysis on small components through a large chamber (300 x 110mm)
  • In-situ micro-mechanical tests (2kN load cell and video capture)
  • Environmental capability.

X-Ray Diffractometer (XRD)

  • The BRUKER D8 ADVANCE with DAVINCI XRD extracts structural information material and phase identification from metals and ceramics
  • Analysis can be completed at ambient and elevated temperatures up to 2000oC
  • Specimens can be in bulk or powder form, thin films, corrosion products or debris
  • Measured properties include phase composition, crystal structure, lattice parameters and mismatches, spatial orientation of crystals, crystallinity, residual stress, grain texture, and layer thickness.

X-ray Computed Tomography Scanner

  • The Nikon XT H 225 LC non-destructively produces high-resolution (1.5μm) volume images of any material based on density contrasts
  • Measures porosity and permeability characterisation, deformation in a solid medium, phase characterisation and in-situ feature measurement
  • Liquid or dry environment
  • Deben CT 10kN cell for specimens imaging in real time under controllable environmental conditions
  • 225kV X-ray source of reflection and transmission.
Optical microscope

Optical Microscopy (OM)

  • The Olympus GX51 inverted microscope suitable for observations of metallographic specimens
  • Wide variety of observation methods including brightfield, darkfield, differential interference contrast, polarisation
  • Magnification range from x50 to x1000
  • Image capture with a 3Mp digital camera.

Mercury Intrusion Porosimetry (MIP) can be completed on special request

SEM Brittle intergranular fracture

SEM scan showing brittle intergranular fracture

3D X-Ray Computed Tomography scan

Complete 3D XCT scan of cement